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Quantitative analysis of scanning electron micrographs
Author(s) -
Hilliard J. E.
Publication year - 1972
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1972.tb03710.x
Subject(s) - magnification , tilt (camera) , planar , scanning electron microscope , optics , linearity , fracture (geology) , volume (thermodynamics) , materials science , boundary (topology) , geometry , mathematics , physics , computer science , mathematical analysis , computer graphics (images) , composite material , quantum mechanics
SUMMARY Scanning electron microscopy (SEM) provides a considerably greater depth of field than optical microscopy at the same magnification. It is therefore particularly suitable for the examination of specimens with irregular surfaces. This review of procedures for quantitative measurements on SEM images falls into two parts. The first deals with mensuration; that is, with the determination of the lengths, dihedral angles and other properties of specific features in the image. Particular emphasis is given to means of correcting for non‐linearity and other distortions caused by instrumental defects. The second part considers the analysis for bulk properties such as volume fraction and boundary area per unit volume. In the case where observations are made on a planar section, these properties can be determined by use of the standard stereological relationships after making a computable correction (where necessary) for the tilt of the specimen and non‐linearities in the scan. However, for irregular surfaces (for example, those produced by fracture) rigorous estimations are not possible without certain assumptions which, unfortunately, are in many cases unrealistic.