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A new stereo‐adaptor for use with the scanning electron microscope
Author(s) -
Unsworth A.,
Hepworth A.
Publication year - 1971
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1971.tb02373.x
Subject(s) - scanning electron microscope , calibration , electron microscope , optics , materials science , microscope , stereo imaging , conventional transmission electron microscope , micrograph , computer science , computer vision , artificial intelligence , scanning transmission electron microscopy , physics , quantum mechanics
Summary A description is given of a new specimen carriage and specimen holder, for use with the scanning electron microscope, to facilitate the preparation of accurate stereo‐micrographs. A detailed calibration procedure shows the apparatus to be extremely reproducible, and giving errors of less than 2% in reported stereo‐measurements.