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The preparation of field‐ion‐microscope specimens containing grain boundaries
Author(s) -
Papazian J. M.
Publication year - 1971
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1971.tb02361.x
Subject(s) - electropolishing , field ion microscope , polishing , materials science , microscope , grain boundary , ion , field (mathematics) , optics , chemistry , composite material , microstructure , physics , mathematics , organic chemistry , electrode , pure mathematics , electrolyte
Summary A back polishing technique has been devised which increases the efficiency of a field‐ion‐microscope study of grain boundaries. The rate of back polishing is predicted from the relationship d m d = 2·5 × 10 4 nm 2 /msec. This relationship is shown to be valid experimentally and theoretically. Its validity implies the persistence of constant current density conditions during electropolishing of sharp, needle‐shaped specimens down to diameters of 100 nm.