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High‐resolution electron microscopy of high‐modulus carbon fibres *
Author(s) -
Crawford D.,
Johnson D. J.
Publication year - 1971
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1971.tb02360.x
Subject(s) - crystallite , materials science , electron microscope , modulus , graphite , recrystallization (geology) , resolution (logic) , lattice (music) , crystallography , optics , high resolution transmission electron microscopy , molecular physics , condensed matter physics , transmission electron microscopy , nanotechnology , composite material , chemistry , physics , paleontology , artificial intelligence , computer science , acoustics , biology , metallurgy
Summary High‐resolution electron‐microscope images of high‐modulus carbon‐fibre fragments have been recorded under conditions which allow resolution of the individual 0.34 nm graphite layer planes. Extinction bands previously observed at low resolution are now seen to originate from several different structural features. Single bands are caused by lattice distortion due to non‐basal edge dislocations and low‐angle boundaries of tilt or twist character; periodic bands are the result of Moiré effects from overlapping or interlinked crystallites. Accurately controlled tilting experiments give further insight into the complex interlinked nature of the crystallites and the results are summarized in terms of a model which is also capable of explaining the partial recrystallization observed with boron doping.