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A simple method for cutting out selected areas from material embedded on slides for electron microscoy
Author(s) -
Ellis D. S.
Publication year - 1971
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1971.tb02287.x
Subject(s) - electron microscope , simple (philosophy) , materials science , scanning electron microscope , electron , composite material , nanotechnology , optics , physics , philosophy , epistemology , quantum mechanics
SUMMARY A simple apparatus is described which enables small plugs of resin containing required specimens to be removed from material (such as smears) previously embedded for electron microscopy on flat microscope slides, without damage, and leaving the remaining material protected for further use.