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An improved hole grid pattern for the relocation of specimens in the electron microscope
Author(s) -
Fursey Anita
Publication year - 1970
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1970.tb02257.x
Subject(s) - electron microscope , conventional transmission electron microscope , microscope , relocation , transmission electron microscopy , high resolution transmission electron microscopy , enhanced data rates for gsm evolution , electron , orientation (vector space) , resolution (logic) , grid , optics , materials science , scanning transmission electron microscopy , physics , computer science , geometry , artificial intelligence , mathematics , programming language , quantum mechanics
SUMMARY An electron‐microscope grid with circular holes arranged in a pattern indicating the orientation of the central area to the edge is described. The grids allow regions observed in a transmission electron microscope to be relocated easily or identified in lower resolution instruments.