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A new technique for specimen manipulation in the scanning electron microscope
Author(s) -
Bywater N. E.,
Buckley T.
Publication year - 1970
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1970.tb02243.x
Subject(s) - scanning electron microscope , materials science , electric field , microscope , optics , nanotechnology , composite material , physics , quantum mechanics
SUMMARY By the use of suitable DC micromotors mounted on the specimen stage of the Cambridge Scanning Electron Microscope (SEM), extra degrees of freedom may be imparted to the specimen, thus enabling a more thorough examination of a surface to be carried out. The properties that make an electric motor suitable for use inside the vacuum specimen chamber are discussed. After showing the way in which DC motors have successfully solved two problems in the fibre field, some further applications are proposed.