Premium
A replica method for the examination of large specimens in the scanning electron microscope
Author(s) -
Stirland D. J.
Publication year - 1970
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1970.tb02234.x
Subject(s) - replica , scanning electron microscope , materials science , electron , electron microscope , fracture (geology) , optics , composite material , physics , art , quantum mechanics , visual arts
SUMMARY A simple replica technique has been used to examine larger than normal size specimens in the scanning electron microscope. Examples of the application of the method to the examination of a steel fracture surface are given, together with a discussion of the limitations of the method.