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The effect of the electron beam on various mounting and coating media in scanning electron microscopy
Author(s) -
Muir M. D.,
Rampley D. N.
Publication year - 1969
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1969.tb00702.x
Subject(s) - adhesive , scanning electron microscope , materials science , coating , composite material , cathode ray , electron microscope , electron beam induced deposition , beam (structure) , optics , electron , scanning transmission electron microscopy , layer (electronics) , physics , quantum mechanics
SUMMARY Eight commonly used specimen adhesives were examined under the ‘Stereo‐scan’ scanning electron microscope to determine the effects of the electron beam on their surface topography. The adhesives were initially examined uncoated, and then coated variously with carbon, and seven different metals and alloys. The effect of the beam on the coated and uncoated adhesives was recorded. The results are presented in tabular form. The purpose of the experiments was to determine the extent of the damage, if any, produced by the beam, on the adhesive, and to try to discover the most damage‐resistant combinations. While combinations are damage‐free, some of the more easily damaged adhesives are regarded as being suitable for certain specialized purposes, where their special properties over‐ride their susceptibility to beam damage.