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Reflected‐light microscopy and scanning electron microscopy applied to the examination of set gypsum plaster texture
Author(s) -
HARBORD N. H.,
MANICOM D. K.,
SMEETON R.
Publication year - 1967
Publication title -
journal of the royal microscopical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0368-3974
DOI - 10.1111/j.1365-2818.1967.tb04495.x
Subject(s) - scanning electron microscope , optical microscope , texture (cosmology) , microscopy , materials science , electron microscope , gypsum , optics , microscope , composite material , computer science , artificial intelligence , physics , image (mathematics)
SYNOPSIS Optical‐microscope techniques for the examination of set gypsum plaster are described. It is shown that, at magnifications below x 1250, reflected‐light microscopy is a suitable technique for the examination of smooth surfaces and yields adequate information on texture. For extremely fine‐textured smooth surfaces or for irregular surfaces the scanning electron microscope must be used.