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ELECTRON MICROSCOPE EXAMINATION OF WHOLE FIBROBLASTS
Author(s) -
Little K.,
Edwards J. H.
Publication year - 1962
Publication title -
journal of the royal microscopical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0368-3974
DOI - 10.1111/j.1365-2818.1962.tb02062.x
Subject(s) - electron microscope , microscope , resolution (logic) , materials science , optics , microscopy , high resolution , optical microscope , scanning electron microscope , physics , computer science , geology , artificial intelligence , remote sensing
T he great advantage that the electron microscope has over the light microscope is increased resolution. To obtain the highest resolution it is necessary to cut thin sections. In cells, such as fibroblasts, which do not have a symmetrical structure, observations on such sections can still leave doubts about the configuration of the cell as a whole. It is of interest, therefore, to examine whole cells, in spite of a certain loss of resolution due to the thickness of the specimen. The resolution obtained is still better than that of the light microscope.