Premium
CARBON SURFACE REPLICAS FOR ELECTRON MICROSCOPY AND ELECTRON DIFFRACTION
Author(s) -
Scott D. B.,
Wyckoff R. W. G.
Publication year - 1955
Publication title -
journal of the royal microscopical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0368-3974
DOI - 10.1111/j.1365-2818.1955.tb00429.x
Subject(s) - electron microscope , electron diffraction , reflection high energy electron diffraction , diffraction , materials science , electron , carbon fibers , microscopy , scanning electron microscope , energy filtered transmission electron microscopy , electron micrographs , electron backscatter diffraction , selected area diffraction , cryo electron microscopy , optics , nanotechnology , transmission electron microscopy , chemistry , scanning transmission electron microscopy , physics , composite material , quantum mechanics , composite number , biochemistry
SYNOPSIS A technique is described for using evaporated carbon films in the preparation of pseudo‐replicas that can be employed for both electron microscopy and electron diffraction. The areas selected microscopically for diffraction can be as small as one square micron. Fluorescent X‐ray analyses can frequently be carried out on the same preparations. The procedure is illustrated from current investigations of tooth enamel and with pseudo‐replicas from a variety of other solids.