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X.—MICROSCOPICAL DETERMINATIONS OF THE THICKNESS OF HISTOLOGICAL SECTIONS
Author(s) -
Brattgård SvenOlof
Publication year - 1954
Publication title -
journal of the royal microscopical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0368-3974
DOI - 10.1111/j.1365-2818.1954.tb02009.x
Subject(s) - depth of field , microscope , optics , optical microscope , focus (optics) , depth of focus (tectonics) , materials science , microscopy , electron microscope , physics , scanning electron microscope , geology , paleontology , subduction , tectonics
SYNOPSIS A theoretical analysis is made of determinations of the thickness of specimens in the microscope, based on Abbe and Berek's formulae. The accuracy of focusing has been stated to amount to one‐fifth of the vertical resolving power. Making full use of the optical system in a Leitz Ortholux microscope, it is calculated to be < ± 0.1μ. The theoretical calculations are verified experimentally. The standard error of the determination of the thickness in the microscope is found experimentally to amount to ±0.16μ,. With a measured thickness of 5μ, the error is thus ±3.2 p.c. Definitions are given of the following terms: depth of focus, depth of field, vertical resolving power, depth of vision, and accuracy of focusing.