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DERIVATION OF LAYER PARAMETERS OF AN ELASTIC MEDIUM FROM REFLECTION COEFFICIENT MATRICES *
Author(s) -
AMINZADEH F.
Publication year - 1984
Publication title -
geophysical prospecting
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.735
H-Index - 79
eISSN - 1365-2478
pISSN - 0016-8025
DOI - 10.1111/j.1365-2478.1984.tb00741.x
Subject(s) - reflection coefficient , electrical impedance , acoustic impedance , reflection (computer programming) , matrix (chemical analysis) , mathematical analysis , impedance parameters , plane (geometry) , plane wave , layer (electronics) , optics , mathematics , materials science , physics , geometry , computer science , composite material , quantum mechanics , programming language
A bstract In this paper we develop a recursive algorithm to obtain the layer parameters of an elastic medium (density, P‐wave velocity, S‐wave velocity) from reflection coefficient matrices in terms of energy flux ratios for a non‐normal incidence case. We define a layer impedance matrix, analogous to the impedance of an acoustic medium. Next we derive a matrix relationship between the layer impedance matrix of the n + 1st layer and the reflection coefficient and parameter matrices of the n th layer. This relationship leads to recursively computing the parameters of the subsurface. We show that the elastic case—unlike the acoustic case—allows one to recover the layer parameters from the impedance matrix for non‐normal incidence. The results of this work play a key role in the solution of the inverse problem with non‐normal‐incidence plane‐wave seismic data when using a downward continuation technique.