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THE BLIND‐ZONE PROBLEM IN MULTIPLE REFRACTION‐LAYER OVERBURDEN SITUATIONS *
Author(s) -
RAGHAVA M. S. VIJAYA,
KUMAR G. NANDA
Publication year - 1979
Publication title -
geophysical prospecting
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.735
H-Index - 79
eISSN - 1365-2478
pISSN - 0016-8025
DOI - 10.1111/j.1365-2478.1979.tb00980.x
Subject(s) - overburden , refraction , fortran , geology , layer (electronics) , mineralogy , optics , computer science , physics , geotechnical engineering , materials science , composite material , operating system
A bstract The blind zone problem is examined with a view to provide a simple means of solving the problem in the general case of arbitrary number of refraction layers constituting the overburden to the masked layers. Considering the first arrival refraction interval corresponding to the masked layer which reduces to zero under blind zone conditions, a method to solve the problem is presented. Derivation of the critical distance expression is also included and convenient solutions to compute the thicknesses of the blind zone and its immediate overlayer are worked out. Based on test calculations on some known instances, the efficacy of the method is illustrated. A Fortran program for use when large numbers of refraction layers are involved under the overburden or when more than one masked layer is encountered is available from the authors.