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BEDROCK DEPTH FROM SURFACE POTENTIAL MEASUREMENTS *
Author(s) -
ROY AMALENDU
Publication year - 1968
Publication title -
geophysical prospecting
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.735
H-Index - 79
eISSN - 1365-2478
pISSN - 0016-8025
DOI - 10.1111/j.1365-2478.1968.tb01814.x
Subject(s) - geology , bedrock , radius , perpendicular , surface (topology) , layer (electronics) , point (geometry) , field (mathematics) , mineralogy , geophysics , geometry , geomorphology , materials science , composite material , computer security , mathematics , computer science , pure mathematics
When, in a two‐layer earth, the substratum is insulating or infinitely conducting, the thickness of the top layer can be determined from surface potential measurements along a radius from a single point power electrode. The observed potential needs to be numerically integrated in a direction perpendicular to the said radius, and Figure 4 can then be used to find the thickness. A field example is included.