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Multi‐orientation thin sectioning for the determination of 3‐D morphology
Author(s) -
SULLIVAN L. A.,
KOPPI A. J.
Publication year - 1987
Publication title -
journal of soil science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.244
H-Index - 111
eISSN - 1365-2389
pISSN - 0022-4588
DOI - 10.1111/j.1365-2389.1987.tb02152.x
Subject(s) - thin section , stack (abstract data type) , materials science , thin film , optics , orientation (vector space) , composite material , thin layer , mineralogy , geology , layer (electronics) , geometry , computer science , physics , mathematics , nanotechnology , programming language
SUMMARY A new soil thin sectioning technique which gives thin cross‐sections (called sliver sections) of thin sections, is described. Optical analysis of soil thin sections and soil sliver sections, using plain, crossed polarized and circularly polarized light provides three‐dimensional information on the micromorphology of clay coatings. This new technique is applied to a common type of clay plug and shows that these features consist of a stack of bowl‐shaped clay coatings.