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Structural Characterization of Lanthanum Chromite Perovskite Coating Deposited by Magnetron Sputtering on an Iron‐Based Chromium‐Containing Alloy as a Promising Interconnect Material for SOFCs
Author(s) -
Orlovskaya Nina,
Coratolo Anthony,
Johnson Christopher,
Gemmen Randall
Publication year - 2004
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2004.tb06350.x
Subject(s) - materials science , amorphous solid , annealing (glass) , sputter deposition , oxide , thin film , perovskite (structure) , chemical engineering , coating , sputtering , lanthanum oxide , metallurgy , composite material , nanotechnology , crystallography , chemistry , engineering
Chromium‐containing stainless steel (SS) is a prospective material for use as an interconnect in solid oxide fuel cells (SOFCs). However, during operations at high temperatures, the growth of oxide scales causes the performance of the interconnect and SOFC as a whole to deteriorate. The coating of SS 446 with a conducting perovskite is a potential method of slowing the growth of oxide scale and, therefore, improving overall SOFC performance. In the present research, the structural characterization of a pure LaCrO 3 thin film on the SS 446 substrates has been performed as a model material that can be used as a barrier coating for the metallic interconnect. The deposition of an amorphous La‐Cr‐O thin film on SS 446 was performed using radio‐frequency (rf) magnetron sputtering. The deposited amorphous film was annealed in air to form the desired perovskite phase. The film underwent an amorphous to LaCrO 4 phase transition during annealing at 500°C with further transformation to LaCrO 3 orthorhombic phase during annealing at 700°C. A self‐organized dendritic structure was reported as a result of the perovskite‐phase formation. Although formation of various oxides, such as Fe 2 O 3 and Fe 3 O 4 , was observed during the annealing of uncoated SS 446 in air, the coating of SS 446 surface with LaCrO 3 film prevented formation of various oxide phases at the interconnect surface. The structural characterization of the films and SS 446 surfaces was accomplished using scanning electron microscopy with energy‐dispersive X‐ray analysis, X‐ray diffractometry, micro‐Raman spectroscopy, and nanoindentation.