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Synthesis of Zinc Aluminate Spinel Film through the Solid‐Phase Reaction between Zinc Oxide Film and α‐Alumina Substrate
Author(s) -
Bi Zhaoxia,
Zhang Rong,
Wang Xusheng,
Gu Shulin,
Shen Bo,
Shi Yi,
Liu Zhiguo,
Zheng Youdou
Publication year - 2003
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2003.tb03609.x
Subject(s) - spinel , materials science , zinc , substrate (aquarium) , analytical chemistry (journal) , phase (matter) , aluminate , auger electron spectroscopy , crystallography , chemistry , metallurgy , oceanography , physics , organic chemistry , chromatography , cement , nuclear physics , geology
We synthesized spinel ZnAl 2 O 4 film on α‐Al 2 O 3 substrate using a solid‐phase reaction between the pulsed‐laser‐deposited ZnO film and α‐Al 2 O 3 substrate. Auger electron spectroscopy showed that the atomic distribution in the spinel ZnAl 2 O 4 was inhomogeneous, which indicated that the reaction was diffusion controlled. Based on X‐ray fluorescence measurements, the apparent growth activation energy of ZnAl 2 O 4 was determined as 504 kJ/mol. X‐ray diffractometry spectra showed that, as the growth temperature increased, the ZnAl 2 O 4 film became disoriented from the single (111) orientation. The ZnAl 2 O 4 (333) diffraction peak shifted toward a small angle, and its full‐width at half‐maximum decreased from 1.30° to 0.37°. At the growth temperature of 1100°C, the morphology of the ZnAl 2 O 4 was initially transformed from islands to stick structures, then to bulgy‐line structures with increased growth time. X‐ray diffractometry spectra showed that these transformations were correlated with changes of ZnAl 2 O 4 orientation.