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Kinetic Process of Reoxidation of Base Metal Technology BaTiO 3 ‐Based Multilayer Capacitors
Author(s) -
Opitz Mathew R.,
Albertsen Knuth,
Beeson James J.,
Hennings Detlev F.,
Routbort Jules L.,
Randall Clive A.
Publication year - 2003
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2003.tb03576.x
Subject(s) - ceramic capacitor , diffusion , electrode , materials science , base metal , capacitor , sintering , diffusion process , reducing atmosphere , process (computing) , metallurgy , voltage , chemistry , electrical engineering , thermodynamics , computer science , knowledge management , physics , innovation diffusion , welding , operating system , engineering
Base metal technology, mainly using Ni electrodes in multilayer ceramic capacitors (MLCCs), is now well established. This technology requires a so‐called reoxidation treatment after sintering the MLCCs in a reducing atmosphere to guarantee a sufficient electrical reliability. Large numbers of electrodes, and production of physically larger components for high‐voltage components, are two technological trends that make the control of the reoxidation process rather difficult. The reoxidation process has been studied to determine oxygen diffusion pathways into commercial MLCCs, using 18 O tracer diffusion and finite element calculations. In MLCCs oxygen diffusion mainly occurs along the Ni electrodes. Furthermore, the reoxidation process is mostly controlled by the thermodynamic potential of the Ni/NiO equilibrium in the interior of the capacitor, but it is the short circuit diffusion along the interface of the electrode that controls the kinetics of the oxygen transport into the interior of the capacitor device.