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Microstructure Characterization of the (1− x )La 2/3 TiO 3 · x LaAlO 3 System
Author(s) -
Lee Hwack Joo,
Park Hyun Min,
Cho Yang Koo,
Nahm Sahn
Publication year - 2003
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2003.tb03482.x
Subject(s) - superlattice , octahedron , electron diffraction , crystallography , transmission electron microscopy , reflection (computer programming) , microstructure , materials science , oxygen , diffraction , phase (matter) , solid solution , condensed matter physics , crystal structure , chemistry , optics , nanotechnology , physics , metallurgy , programming language , optoelectronics , organic chemistry , computer science
Microstructural characterizations on the (1− x )La 2/3 TiO 3 · x LaAlO 3 (LTLA) system were conducted using transmission electron microscopy. The presence of La 2 Ti 2 O 7 and La 4 Ti 9 O 24 phases in pure La 2/3 TiO 3 is confirmed by the electron diffraction pattern. When x = 0.1, the ordering due to the A‐site vacancies could be confirmed by the presence of antiphase boundaries (APBs) and return ½(100) superlattice reflection. As x increases, the ordering decreases and finally disappears when x = 0.6. The tilting of oxygen octahedra could be demonstrated by the presence of the ferroelastic domains in the matrix and return ½(111) and return ½(110) superlattice reflections in selected area electron diffraction patterns. In pure LaAlO 3 , only the antiphase tilting of oxygen octahedra is present due to the presence of return ½(111) superlattice reflection. In the LTLA system of x = 0.1, both the antiphase and in‐phase tiltings of the oxygen octahedra are involved; however, in the range of x from 0.3 to 0.9, the antiphase tilting of oxygen octahedra has appeared. The growth of the ferroelastic domains is influenced by the APBs in the matrix.