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Effect of Titania and Lithia Doping on the Boundary Migration of Alumina under an Electric Field
Author(s) -
Choi JaeIl,
Han JooHwan,
Kim DohYeon
Publication year - 2003
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2003.tb03352.x
Subject(s) - doping , grain boundary , electric field , materials science , boundary (topology) , condensed matter physics , field (mathematics) , analytical chemistry (journal) , mineralogy , chemistry , microstructure , metallurgy , physics , mathematics , optoelectronics , chromatography , quantum mechanics , mathematical analysis , pure mathematics
Boundary migration under an electric field was investigated for pure, TiO 2 ‐doped, and Li 2 O‐doped Al 2 O 3 specimens. Boundary migration rates in TiO 2 ‐doped and Li 2 O‐doped Al 2 O 3 specimens were much faster compared with that of pure Al 2 O 3 . In all specimens, the migration rate was observed to depend on the applied bias direction. Compared with pure Al 2 O 3 , the dependence of boundary migration on bias direction became more pronounced in TiO 2 ‐doped Al 2 O 3 but less pronounced in Li 2 O‐doped Al 2 O 3 . The results were explained in terms of the variation of grain sizes, mobility, and electrostatic potential of boundaries because of doping.