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Raman Spectroscopy of Nanocrystalline Ceria and Zirconia Thin Films
Author(s) -
Kosacki Igor,
Petrovsky Vladimir,
Anderson Harlan U.,
Colomban Philippe
Publication year - 2002
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2002.tb00509.x
Subject(s) - raman spectroscopy , nanocrystalline material , materials science , microstructure , raman scattering , cubic zirconia , yttria stabilized zirconia , thin film , phonon , analytical chemistry (journal) , mineralogy , optics , nanotechnology , ceramic , composite material , condensed matter physics , chemistry , physics , chromatography
The results of Raman‐scattering studies of nanocrystalline CeO 2 and ZrO 2 :16% Y (YSZ) thin films are presented. The relationship between the lattice disorder and the form of the Raman spectra is discussed and correlated with the microstructure. It is shown that the Raman line shape results from phonon confinement and spatial correlation effects and yields information about the material nonstoichiometry level.