Premium
Crystal Structure of Lu 4 Si 2 O 7 N 2 Analyzed by the Rietveld Method Using the Time‐of‐Flight Neutron Powder Diffraction Pattern
Author(s) -
Takahashi Junichi,
Yamane Hisanori,
Shimada Masahiko,
Yamamoto Yoshinobu,
Hirosaki Naoto,
Mitomo Mamoru,
Oikawa Kenichi,
Torii Shuki,
Kamiyama Takashi
Publication year - 2002
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2002.tb00406.x
Subject(s) - monoclinic crystal system , lutetium , crystallography , neutron diffraction , crystal structure , powder diffraction , rietveld refinement , materials science , atom (system on chip) , x ray crystallography , diffraction , chemistry , physics , optics , embedded system , computer science , yttrium , metallurgy , oxide
The crystal structure of a lutetium silicon oxynitride (Lu 4 Si 2 O 7 N 2 ) was analyzed by the Rietveld method using time‐of‐flight (TOF) neutron powder diffraction data. The compound crystallizes in a monoclinic cell, space group P 2 1 / c (No. 14‐1) with a = 7.4243(1), b = 10.2728(1), c = 10.6628(1) Å, and β= 109.773(1)° at 297 K. One nitrogen atom in Lu 4 Si 2 O 7 N 2 occupies the bridging site between the two Si atoms, and the other one is statistically situated at the terminal sites of Si 2 O 5 N 2 ditetrahedra. In the local structure, Si 2 O 5 N 2 ditetrahedra consist of SiO 3 N and SiO 2 N 2 tetrahedral units sharing the N atom. Lu atoms are in sixfold, sevenfold (×2) and eightfold coordinations of O/N atoms. X‐ray powder diffraction data were also analyzed with the model obtained by the neutron diffraction.