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Defect and Mixed Conductivity in Nanocrystalline Doped Cerium Oxide
Author(s) -
Suzuki Toshio,
Kosacki Igor,
Anderson Harlan U.
Publication year - 2002
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2002.tb00302.x
Subject(s) - nanocrystalline material , materials science , microstructure , conductivity , ionic conductivity , grain size , activation energy , grain boundary , electrical resistivity and conductivity , doping , thin film , chemical engineering , composite material , nanotechnology , electrolyte , chemistry , optoelectronics , electrode , engineering , electrical engineering
The results obtained from a study on the microstructure and the electrical properties of Gd‐doped CeO 2 thin films were reported. Dense, nanocrystalline films on sapphire substrates are prepared using a polymeric precursor spin coating technique. The electrical conductivity was studied as a function of temperature and oxygen activity and correlated with the grain size. For nanocrystalline Gd‐doped CeO 2 thin films, the ionic conductivity increased with decreasing activation energy as the grain size decreased. A conductivity model was developed to analyze P O2 behavior of the electrical conductivity. Using the conductivity model, the hopping energy of electron conduction and the enthalpy of oxygen vacancy formation were determined for different microstructures.