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Synchrotron Radiation Diffraction Study of the Microstructure Changes in Cement Paste due to Accelerated Leaching by Application of Electrical Fields
Author(s) -
Castellote Marta,
Andrade Carmen,
Alonso Cruz,
Turrillas Xavier,
Kvick Åke,
Terry Ann,
Vaughan Gavin,
Campo Javier
Publication year - 2002
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2002.tb00142.x
Subject(s) - materials science , amorphous solid , dissolution , microstructure , cement , synchrotron radiation , diffraction , rietveld refinement , leaching (pedology) , powder diffraction , synchrotron , mineralogy , composite material , chemical engineering , crystallography , chemistry , optics , geology , physics , engineering , soil science , soil water
An external dc voltage was applied to cured cement pastes to simulate their natural degradation over time; i.e . migration of ions and dissolution of solid phases. The presence of crystalline phases before and after applying a voltage was quantified by powder diffraction using synchrotron X‐ray radiation. The results were refined by the Rietveld method. The specimens were also analysed by mercury intrusion porosimetry. Results indicated that a portion of the crystalline phases dissolved and later precipitated as amorphous phases in smaller pores. This accelerated treatment led to the formation of a larger proportion of amorphous phases in the specimens studied.