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Direct‐Write Fabrication of Pb(Nb,Zr,Ti)O 3 Devices: Influence of Paste Rheology on Print Morphology and Component Properties
Author(s) -
Morissette Sherry L.,
Lewis Jennifer A.,
Clem Paul G.,
Cesarano Joseph,
Dimos Duane B.
Publication year - 2001
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2001.tb01036.x
Subject(s) - materials science , rheology , scanning electron microscope , microstructure , composite material , fabrication , dielectric , shear thinning , dispersant , mineralogy , dispersion (optics) , optics , optoelectronics , medicine , chemistry , alternative medicine , physics , pathology
Lead niobium zirconate titanate (PNZT) pastes with tailored rheological properties have been developed for direct‐write fabrication of thick‐film capacitor elements in highly integrated, multifunctional electroceramic devices. Such pastes exhibited pseudoplastic behavior with a low shear apparent viscosity of roughly 1 × 10 6 cP. On aging, the degree of shear thinning and the low shear apparent viscosity decreased. Pastes prepared from as‐received powders attained printable, steady‐state viscosities of ∼2 × 10 5 cP after 50 days of aging. In contrast, pastes prepared from dispersant‐coated powders showed no measurable rheological changes after 1 day of aging. Square elements were patterned on dense alumina substrates or Teflon sheets. Leveling behavior as a function of time for single line prints, and the resulting surface topographies of dried PNZT films were measured by laser profilometry. PNZT layers sintered at varying temperatures between 950° and 1050°C for 5 h in either air or a lead‐rich atmosphere yielded porous microstructures as revealed by scanning electron microscopy (SEM). Such layers exhibited dielectric constants ( K ) of 1400–1570 at 1 kHz with dissipation factors ( D ) of less than 4.1%.