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Strength‐Limiting Surface Damage in Single‐Crystal Sapphire Imaged by X‐ray Topography
Author(s) -
Black David
Publication year - 2001
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2001.tb01013.x
Subject(s) - sapphire , microstructure , materials science , fracture (geology) , diffraction , composite material , fabrication , limiting , characterization (materials science) , single crystal , optics , crystal (programming language) , surface (topology) , crystallography , laser , geometry , nanotechnology , chemistry , physics , medicine , mechanical engineering , programming language , alternative medicine , pathology , computer science , engineering , mathematics
X‐ray topography was used in an effort to understand the relationship between microstructure and fracture strength in single‐crystal sapphire bend bars. The bars were indistinguishable using standard optical characterization techniques, but X‐ray diffraction topography revealed that they could be separated into two distinct types. The first type had an oriented microstructure consisting of a pattern of linear features parallel to the long axis of the bars. This microstructure was attributed to fabrication damage. The second type was well‐polished, nearly damage‐free sapphire. Fracture strength data showed that the damaged bars had strengths less than 70% of the bars without damage.