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Imaging Secondary‐Ion Mass Spectroscopy Observation of the Scavenging of Siliceous Film from 8‐mol%‐Yttria‐Stabilized Zirconia by the Addition of Alumina
Author(s) -
Lee JongHeun,
Mori Toshiyuki,
Li JiGuang,
Ikegami Takayasu,
Komatsu Manabu,
Haneda Hajime
Publication year - 2000
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.2000.tb01366.x
Subject(s) - grain boundary , yttria stabilized zirconia , secondary ion mass spectrometry , cubic zirconia , materials science , conductivity , analytical chemistry (journal) , grain size , electrical resistivity and conductivity , mineralogy , scavenging , ion , ceramic , metallurgy , chemistry , microstructure , organic chemistry , chromatography , electrical engineering , engineering , biochemistry , antioxidant
The scavenging of a resistive siliceous phase via the addition of Al 2 O 3 was studied, using imaging secondary‐ion mass spectroscopy (SIMS), given the improved grain‐boundary conductivity in 8‐mol%‐yttria‐stabilized zirconia (8YSZ). The grain‐boundary resistivity in 8YSZ decreased noticeably with the addition of 1 mol% of Al 2 O 3 . Strong SiO 2 segregation at the grain boundaries was observed in a SIMS map of pure 8YSZ that contained 120 ppm of SiO 2 (by weight). The addition of 1 mol% of Al 2 O 3 caused the SiO 2 to gather around the Al 2 O 3 particles. The present observations provided direct and visual evidence of SiO 2 segregation at the grain boundaries (which had a deleterious effect on grain‐boundary conductivity) and the scavenging of SiO 2 via Al 2 O 3 addition.