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A New Metastable Thin‐Film Strontium Tantalate Perovskite
Author(s) -
Rodriguez Mark A.,
Boyle Timothy J.,
Hernandez Bernadette A.,
Tallant David R.,
Vanheusden Karel
Publication year - 1999
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1999.tb02047.x
Subject(s) - tantalate , perovskite (structure) , materials science , raman spectroscopy , rietveld refinement , strontium , crystallite , dielectric , thin film , analytical chemistry (journal) , mineralogy , phase (matter) , metastability , crystallography , crystal structure , chemistry , nanotechnology , ferroelectricity , metallurgy , optics , chromatography , physics , optoelectronics , organic chemistry
A novel Sr‐Ta‐O perovskite phase has been synthesized by a chemical preparation route and crystallized on Pt‐coated SiO 2 /Si substrates at ∼800°C. The phase was isolated as a thin film only (not as a polycrystalline powder) and is likely metastable. SEM, EDS, XRD, EPR, and Raman analyses suggest this phase is cation‐deficient, having the formula Sr x Ta x O 3 ( x ∼ 0.85). X‐ray Rietveld analysis indicates the structure to be a simple‐cubic perovskite‐type lattice; Pm 3 m space group, a = 3.955(2) Å, V = 61.86 Å 3 , Z = 1. Electrical property measurements recorded a dielectric constant k of ∼16 with a tan delta of 0.04.