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Rapid and Sensitive Radioscopy for Fine Ceramics Using an Image‐Subtraction Method
Author(s) -
Ikeda Yasushi,
Mizuta Yasutoshi,
Onda Katsuhiro
Publication year - 1999
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1999.tb01849.x
Subject(s) - image subtraction , ceramic , subtraction , materials science , background subtraction , reliability (semiconductor) , noise (video) , optics , sensitivity (control systems) , image processing , image noise , image (mathematics) , computer vision , computer science , mathematics , physics , pixel , composite material , binary image , power (physics) , arithmetic , engineering , quantum mechanics , electronic engineering
A new microfocus X‐ray testing method has been developed to detect very small defects in ceramic products with high speed and reliability. By using image subtraction, enhanced X‐ray images of defects were extracted from the background noise. Much‐better sensitivity (e.g., 0.1% in Si 3 N 4 that was 20 mm thick) was obtained within a few minutes. This method is considerably superior to the conventional film method. In this study, Si 3 N 4 test pieces (penetrameters) that had very small artificial defects (such as slits and pores) were prepared and examined by using the new method.