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Anisotropy of Silicon Nitride with Aligned Silicon Nitride Whiskers
Author(s) -
Park DongSoo,
Kim ChangWon
Publication year - 1999
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1999.tb01836.x
Subject(s) - whisker , whiskers , silicon nitride , materials science , nitride , sintering , silicon , anisotropy , monocrystalline whisker , composite material , shrinkage , optoelectronics , optics , layer (electronics) , physics
A model based on anisotropic sintering shrinkage of silicon nitride with aligned silicon nitride whisker seeds was built in order to provide an easy way to obtain information on how the large elongated grains were aligned. The method requires a simple measuring device for the information. XRD analysis showed a good correlation with predictions of the model. Both predictions of the model and experimental results indicated that the fraction of aligned large elongated grains increased as the whisker content increased.