Premium
Epitaxial Thin Film Growth of Lanthanum and Neodymium Aluminate Films on Roll‐Textured Nickel Using a Sol‐Gel Method
Author(s) -
Shoup Shara S.,
Paranthaman M.,
Goyal Amit,
Specht Eliot D.,
Lee Dominic F.,
Kroeger Donald M.,
Beach David B.
Publication year - 1998
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1998.tb02731.x
Subject(s) - full width at half maximum , epitaxy , materials science , substrate (aquarium) , thin film , nickel , texture (cosmology) , pole figure , analytical chemistry (journal) , optics , optoelectronics , composite material , metallurgy , nanotechnology , chemistry , layer (electronics) , oceanography , image (mathematics) , physics , chromatography , artificial intelligence , computer science , geology
As part of an effort to develop a new, non‐vacuum‐processed substrate for high current superconducting films, thin films of LaAlO 3 and NdAlO 3 were deposited on biaxially textured (100) nickel substrates using a solution deposition technique. On heating to 1150°C in Ar‐4% H 2 for 1 h, epitaxial films were obtained. Out‐of‐plane alignment was confirmed by obtaining rocking curves of the (002) plane of the LaAlO 3 (full width at half‐maximum (fwhm) = 7.2°) and the NdAlO 3 (fwhm = 5.8°) films. In‐plane alignment was demonstrated by obtaining phi scans of the (110) plane of the LaAlO 3 (fwhm = 13.4°) and the NdAlO 3 (fwhm = 8.8°) films. Grain alignment in the films is approximately equivalent to the alignment of the Ni substrate. Analysis of pole figures indicated that in both films there are two in‐plane orientations present, the major being (001)[100] and the minor (001)[110].