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TEM/EELS Characterization of a Sintered Polycrystalline Silicon Carbide Fiber
Author(s) -
Tenailleau H.,
Bourrat Xavier,
Naslain Roger,
Tressler Richard E.,
Giannuzzi Lucille A.
Publication year - 1998
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1998.tb02585.x
Subject(s) - materials science , crystallite , silicon carbide , grain boundary , fiber , composite material , stoichiometry , carbide , characterization (materials science) , mineralogy , microstructure , metallurgy , nanotechnology , chemistry , organic chemistry
A sintered, polycrystalline SiC fiber has been characterized by TEM and EELS. The fibers consist primarily of alpha‐SiC (6H‐polytype) with a mean grain size on the order of approximately 1 μm. Poorly organized turbostratic carbon is located within porous regions between some grain boundaries and triple junctions of the SiC. In addition, 100 nm spherical boron carbide precipitates are observed intragranularly within the SiC grains. These precipitates have a rhombohedral crystal structure with an approximate stoichiometry of B 4 C.