Nonuniform Heating in Zinc Oxide Varistors Studied by Infrared Imaging and Computer Simulation

State‐of‐the‐art infrared (IR) thermal imaging was used to monitor the heating of ZnO varistors by electrical transients. On a macroscopic scale (e.g., 10 mm), heating in large varistor blocks (i.e., diameter of 42 mm) was found to be the greatest near the block edges and to be approximately radially symmetric in blocks fabricated at a low aspect ratio. In blocks fabricated at a higher aspect ratio, the heating was less symmetric, presumably because uniform properties are more difficult to achieve. Nonuniform heating in large blocks can be attributed to processing‐induced variations in the electrical properties of the blocks. On an intermediate size scale (e.g., 1 mm), the heating in small varistor disks (e.g., diameter of 10 mm) was observed to be most intense along localized electrical paths. The high electrical conductivity of these paths originates from the statistical fluctuations in properties that inevitably occur in polycrystalline materials. On a microscopic scale (e.g., 10 μm), the heating in thin varistor slices (e.g., thickness of 100 μm) was observed to be localized in strings of tiny hot spots. The hot spots occur at the grain boundaries in a conducting path, where the potential is decreased across Schottky‐type barriers and the heat is generated. The experimentally observed heating is interpreted by applying transport theory and using computer simulations. It is shown that, on the scale of the grain size, the heat transfer is too fast to permit temperature differences that could cause a varistor failure. Current localization and nonuniform heating on an intermediate size scale can have a microstructural origin (e.g., statistical fluctuations of grain sizes and grain‐boundary properties). However, these are shown to be significant only in small varistors, whereas destructive failures (puncture and cracking) of large varistor blocks can be caused only by nonuniform heating on a macroscopic scale.