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Microstructure and Dielectric Properties of YMnO 3 Thin Films Prepared by Dip‐Coating
Author(s) -
Kitahata Hiroya,
Tadanaga Kiyoharu,
Minami Tsutomu,
Fujimura Norifumi,
Ito Taichiro
Publication year - 1998
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1998.tb02491.x
Subject(s) - microstructure , materials science , crystallite , dielectric , thin film , coating , dip coating , composite material , sol gel , mineralogy , analytical chemistry (journal) , nanotechnology , metallurgy , chemistry , optoelectronics , chromatography
YMnO 3 thin films with Y/Mn ratios from 1.00/1.05 to 1.00/0.90 were prepared by dip‐coating from solution, in which starting materials were refluxed, and the effects of the Y/Mn ratio on the structure and dielectric properties of YMnO 3 thin films were investigated. XRD measurements indicated that the films with the Y/Mn ratios in this study were a single phase of polycrystalline YMnO 3 . The lattice constants along the a ‐axis and c ‐axis lengthened with an increase in the Y/Mn ratio. FE‐SEM micrographs of the films showed that the surface of the films became smoother and denser with an increase in the Y/Mn ratio. YMnO 3 thin films with good dielectric properties were obtained with an Y/Mn ratio of 1.00/0.90, which gave the smoothest and densest microstructure and the smallest leakage current.