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Structural Investigation of 95(0.6Li 2 S0.4SiS 2 )5Li 4 SiO 4 Oxysulfide Glass by Using X‐ray Photoelectron Spectroscopy
Author(s) -
Hayashi Akitoshi,
Tatsumisago Masahiro,
Minami Tsutomu,
Miura Yoshinari
Publication year - 1998
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1998.tb02482.x
Subject(s) - x ray photoelectron spectroscopy , oxygen atom , oxygen , sulfur , deconvolution , analytical chemistry (journal) , materials science , quenching (fluorescence) , spectral line , spectroscopy , chemistry , molecule , nuclear magnetic resonance , optics , metallurgy , physics , fluorescence , organic chemistry , astronomy , quantum mechanics
S2 p and O1 s photoelectron spectra were obtained for the 95(0.6Li 2 S0.4SiS 2 )5Li 4 SiO 4 oxysulfide glass prepared by twin‐roller quenching. A four‐peak deconvolution technique was used to separate the S2 p peak of the glass into the components of bridging and nonbridging sulfur atoms. As a result of the deconvolution of the S2 p peak, we found that ∼92% of the sulfur atoms were present as nonbridging atoms. The O1 s peak of the glass was separated into two components: bridging and nonbridging oxygen atoms. This separation of the O1 s peak indicated that ∼85% of the oxygen atoms were present as bridging oxygen atoms.