Premium
Detection of Minor Crystalline Phases in Alumina Ceramics Using Synchrotron Radiation Diffraction
Author(s) -
Latella Bruno A.,
O'Connor Brian H.
Publication year - 1997
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1997.tb03216.x
Subject(s) - synchrotron radiation , diffraction , ceramic , materials science , x ray crystallography , powder diffraction , synchrotron , phase (matter) , beamline , impurity , optics , mineralogy , crystallography , chemistry , physics , metallurgy , beam (structure) , organic chemistry
The use of synchrotron radiation diffraction (SRD) in con‐junction with conventional laboratory X‐ray diffraction (XRD) for analyzing the phase assemblage of selected alu‐mina‐based ceramics is described. This paper outlines the benefits of synchrotron powder diffraction in resolving mi‐norand impurity phases in various alumina ceramics. Laboratory XRD is shown to provide only cursory details of minor crystalline phases which are strikingly evident and clearly defined from application of SRD analysis. The po‐tential of SRD techniques to characterize low‐level crystal‐line phases and as a check for “phase purity” in ceramic systems is considered.