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Tetragonal‐to‐Cubic Structural Phase Transition in Pollucite by Low‐Temperature X‐ray Powder Diffraction
Author(s) -
Yanase Ikuo,
Kobayashi Hidehiko,
Shibasaki Yoshio,
Mitamura Takashi
Publication year - 1997
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1997.tb03175.x
Subject(s) - tetragonal crystal system , atmospheric temperature range , powder diffraction , rietveld refinement , crystallography , lattice constant , x ray crystallography , materials science , phase transition , diffraction , phase (matter) , transition temperature , crystal structure , chemistry , condensed matter physics , optics , thermodynamics , physics , organic chemistry , superconductivity
The tetragonal‐to‐cubic structural phase transition in pollucite (CsAlSi 2 O 6 ) was investigated using low‐temperature X‐ray powder diffraction in the temperature range of 93 to 298 K, and the lattice constants were refined with Rietveld analysis. It was found that CsAlSi 2 O 6 had a tetragonal phase with a space group of I 4 1 /acd in the temperature range of 93 to 248 K, a = 1.36337(4) nm, c = 1.36988(6) nm at 248 K, and underwent a phase transition from tetragonal to cubic with a space group of Ia‐3 in the temperature range of 248 to 273 K, a = 1.36645(3) nm at 273 K.