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Microstructure and Phase Stability of Yttria‐Doped Tetragonal Zirconia Polycrystals Heat Treated in Nitrogen Atmosphere
Author(s) -
Chung TaiJoo,
Song Huesup,
Kim GyeungHo,
Kim DohYeon
Publication year - 1997
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1997.tb03163.x
Subject(s) - materials science , microstructure , yttria stabilized zirconia , cubic zirconia , annealing (glass) , tetragonal crystal system , transmission electron microscopy , nitrogen , doping , surface layer , composite material , layer (electronics) , mineralogy , phase (matter) , metallurgy , analytical chemistry (journal) , chemical engineering , ceramic , chemistry , nanotechnology , optoelectronics , organic chemistry , chromatography , engineering
The low‐temperature degradation of zirconia (ZrO 2 ) that was doped with 3 mol% yttria (Y 2 O 3 ) (3Y‐TZP) was prevented by the heat treatment of sintered specimens in nitrogen. The heat treatment of sintered specimens resulted in a surface layer that was stabilized by nitrogen ions, whereas the interior was only slightly affected by the heat treatment. X‐ray diffractometry and transmission electron microscopy analyses revealed that the stabilized surface layer consisted of cubic grains with tetragonal precipitates. Although the presence of the surface layer decreased the strength of the sintered 3Y‐TZP, the strength of nitrified specimens was maintained when low‐temperature annealing was applied.