Premium
Structural Analysis of Inclusions in β‐Silicon Carbide Whiskers Grown from Rice Hulls
Author(s) -
Knowles Kevin M.,
Ravichandran Maharajapuram V.
Publication year - 1997
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1997.tb02959.x
Subject(s) - whiskers , silicon carbide , dark field microscopy , microcrystalline , materials science , transmission electron microscopy , diffraction , electron diffraction , whisker , substructure , rice hulls , electron backscatter diffraction , crystallography , composite material , optics , microstructure , chemistry , microscopy , nanotechnology , physics , structural engineering , engineering
Microcrystalline inclusions in the core of β‐SiC whiskers derived from the pyrolysis of rice hulls have been studied by transmission electron microscopy using conventional brightfield and dark‐field imaging. The electron diffraction patterns from the whiskers show extra reflections arising from these inclusions. Dark‐field images from these reflections are consistent with the presence of three different variants of inclusions, all of which are oriented with their [001] axes parallel to the heavily faulted [111] growth axis of the whiskers. A structural model for these inclusions is proposed which accounts satisfactorily for the extra reflections in the electron diffraction patterns.