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Dopant Distributions in Rare‐Earth‐Doped Alumina
Author(s) -
Thompson A. Mark,
Soni Kamal K.,
Chan Helen M.,
Harmer Martin P.,
Williams David B.,
Chabala Jan M.,
LeviSetti Riccardo
Publication year - 1997
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1997.tb02840.x
Subject(s) - yttrium , lanthanum , materials science , dopant , grain boundary , doping , crystallite , mineralogy , analytical chemistry (journal) , inorganic chemistry , metallurgy , microstructure , chemistry , optoelectronics , chromatography , oxide
The distribution of yttrium and lanthanum dopants has been mapped in yttrium‐ and lanthanum‐doped polycrystalline aluminas using imaging secondary‐ion mass spectrometry (imaging‐SIMS). Both dopants segregate to grain boundaries and pore surfaces. On average, yttrium occupies 7.1%–9.0% of the available grain‐boundary cation sites, whereas lanthanum occupies only 2.0%–5.2%. In 1000‐ppm‐yttrium‐doped alumina, an abundance of yttrium aluminum garnet precipitates also is observed. Implications of these observations to the creep behavior of alumina are discussed. The similarity in the segregation behavior of yttrium and lanthanum highlights the potential of lanthanum‐doped alumina for improved creep properties.