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Investigation of the Electronic Structure of Y 2 Cu 2 O 5–x S x (x — 0.0, 0.25, 0.75) by X‐ray Emission Spectroscopy and X α Scattered Wave Calculation Methods
Author(s) -
Uvarov Victor N.,
Timoshevskaya Liliya V,
Obolenskii Michail A.
Publication year - 1996
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1996.tb08530.x
Subject(s) - superconductivity , electronic structure , copper , polyhedron , spectroscopy , x ray , x ray spectroscopy , high temperature superconductivity , chemistry , analytical chemistry (journal) , materials science , condensed matter physics , crystallography , physics , optics , metallurgy , geometry , mathematics , chromatography , quantum mechanics
The investigation of the electronic properties of various copper oxides, containing structural fragments with specific Cu‐O polyhedra, has been carried out. The electronic structure of Y 2 Cu 2 O 5–x S x compounds (x = 0.0, 0.25, 0.75) has been studied by X‐ray emission spectroscopy and the X α scattered wave (SW) method of calculation. It is shown that substituting apical oxygen by sulfur in the squarepyramid fragments in high‐temperature superconductors will result in a decrease of the density of hole carriers in “superconducting” grids of CuO 2 and in the suppression of superconductivity .