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Journal YBCO Thin Film Formation near the Stability Line by Resistive Evaporation of BaF2, Cu, and Y
Author(s) -
Azoulay Jacob
Publication year - 1996
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1996.tb08172.x
Subject(s) - annealing (glass) , materials science , resistive touchscreen , high temperature superconductivity , evaporation , fluorine , thin film , analytical chemistry (journal) , superconductivity , mineralogy , chemical engineering , composite material , chemistry , condensed matter physics , nanotechnology , thermodynamics , metallurgy , electrical engineering , physics , chromatography , engineering
A single resistively heated source was used to deposit a mixture of BaF 2 , Cu, and Y to form precursor films onto MgO substrates held at room temperature. Different heat treatment conditions were applied to study the stability diagram of YBa 2 Cu 3 O 7−x . It was found that the stability line is shifted toward the higher oxygen partial pressure and lower temperature side of the pure YBCO line in the presence of fluorine and fluorides in the precursor. Films of good quality were obtained when the annealing conditions were in close proximity to this line.