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Direction of Liquid Film Migration Induced by Chromic Oxide in Alumina‐Anorthite
Author(s) -
Paek YeongKyeun,
Lee HoYong,
Kang SukJoong L.
Publication year - 1996
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1996.tb08073.x
Subject(s) - anorthite , materials science , grain boundary , corundum , oxide , diffusion , mineralogy , phase (matter) , composite material , metallurgy , thermodynamics , microstructure , chemistry , physics , organic chemistry
Three kinds of single‐crystalline alumina plates with the crystallographic planes of C, m, and R were diffusion‐bonded with liquid‐phase sintered (98)alumina‐(2)anorthite (in wt%) plates (P) and then heat‐treated at 1600°C under a Cr 2 0 3 ‐containing atmosphere. During the heat treatment, for all of the specimens studied, the anorthite liquid films between alumina plates migrated to grains with surface orientation corresponding to higher coherency strain energy. This result is in better agreement with a prediction based on the coherency strain theory than the previous one obtained for grain‐boundary migration. The discrepancy between the predicted and previously observed migration directions of some grain boundaries in alumina may therefore be attributed to an effect of grain‐boundary structure and stress transmission across the boundary.