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Glass/Substrate Interaction in Model RuO 5 ‐Glass Double‐Layer Thick Films
Author(s) -
Nakano Takashi,
Iizuka Toshihiro,
Takada Tomoyuki,
Yamaguchi Takashi
Publication year - 1995
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1995.tb08876.x
Subject(s) - layer (electronics) , materials science , electron microprobe , substrate (aquarium) , dissolution , composite material , double layer (biology) , mineralogy , chemical engineering , metallurgy , chemistry , oceanography , engineering , geology
Chemical interaction between RuO 2 ‐glass thick‐film resistors and substrates was studied by observing microstructural changes in model double‐layer thick films, which were composed of a top glass layer and an RuO 2 layer. The concentration profiles of Al, Pb, and Ru in the film were analyzed. A new glass layer formed on the alumina substrate during firing, the formation of which resulted from dissolution of A1 2 O 3 into glass. A mechanism of microstructural changes has been proposed based on the results of EPMA.