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Segregation in Single‐Crystal Fully Stabilized Yttria‐Zirconia
Author(s) -
Hughes Anthony E.
Publication year - 1995
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1995.tb08810.x
Subject(s) - yttria stabilized zirconia , cubic zirconia , materials science , single crystal , crystallography , chemical engineering , chemistry , ceramic , composite material , engineering
X‐ray photoelectron spectroscopy (XPS) has been used to study surface segregation in 9.5 mol% single‐crystal Y 2 O 3 ‐ZrO 2 which has been subjected to air anneals at temperatures ranging from 900° to 1500°C. The kinetics of segregation reveal an enrichment of Y, Si, Na, and Fe at short times; however, at longer times surface equilibrium is reached. The heats of segregation for Y, Si, Na and Fe, determined from Arrhenius plots, were 9.3 ± 3.0, 59.0 ± 7.0, –23.5 ± 11.5, –18.0 ± 6.0 kJ/mol, respectively. XPS analysis of the equilibrium states at all temperatures revealed a distinct surface layer which, given the positive heats of segregation for Si and Y, is quite stable.