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Direct Observation of Channel Structures in Zeolite Y and A with a Slow‐Scan, Charge‐Coupled‐Device Camera
Author(s) -
Sasaki Yukichi,
Suzuki Toshiyuki,
Ikuhara Yuichi,
Saji Akira
Publication year - 1995
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1995.tb08506.x
Subject(s) - zeolite , irradiation , materials science , cathode ray , electron , electron microscope , electron beam processing , resolution (logic) , optics , scanning electron microscope , charge coupled device , cleavage (geology) , analytical chemistry (journal) , chemistry , catalysis , physics , composite material , biochemistry , chromatography , quantum mechanics , artificial intelligence , fracture (geology) , computer science , nuclear physics
Zeolite materials are very sensitive to electron beam irradiation. Therefore, there have been only limited attempts to characterize their structures using high‐resolution electron microscopy (HREM). The sensitivity to the electron beam depends strongly on the Si/Al ratio in zeolites. A slow‐scan, charge‐coupled‐device (CCD) camera provides the possibility to observe materials using HREM with very low beam doses. In this study, this method was applied to observe sensitive materials such as zeolite type A and type Y, and HREM images were recorded without any damage caused by electron irradiation under a dose density less than 0. 2 A /cm 2 . It was found that fine channel structures, cleavage planes, and the electron irradiation process in the zeolites could be characterized using HREM with the slow‐scan CCD camera.