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Sol‐Gel Processing and Conduction Mechanism of RuO 2 ‐Glass Thick‐Film Resistors
Author(s) -
Yamaguchi Takashi,
Nakamura Yuko
Publication year - 1995
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1995.tb08496.x
Subject(s) - materials science , thermal conduction , percolation (cognitive psychology) , resistor , silicate glass , percolation theory , composite material , conductivity , sol gel , mineralogy , chemistry , nanotechnology , electrical engineering , voltage , neuroscience , biology , engineering
Sol‐gel processing was used to study the conduction mechanism in RuO 2 ‐glass thick‐film resistors (TFRs). The relation between resistance and conductive particle concentration was studied on TFRs with uniformly dispersed RuO 2 particles in lead silicate glass. The resistance‐concentration relation was best expressed by the percolation theory, whereas conventional TFRs showed a marked deviation. Conductivity measurements and Auger spectroscopy of glass films heated in contact with RuO 2 films revealed appreciable dissolution of RuO 2 in glass. Summarizing the experimental results, a percolation theory has been proposed as a possible conduction mechanism.