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Effects of Silver Doping on the Reliability of (Pb 0.875 Ba 0.125 )[(Mg 1/3 Nb 2/3 ) 0. 5(Zn 1/3 Nb 2/3 ) 0.3 Ti 0.2 ] O 3 Relaxor Dielectric Ceramics
Author(s) -
Kanai Hideyuki,
Furukawa Osamu,
Nakamura Shinichi,
Hayashi Masaru,
Yoshiki Masahiko,
Yatnashita Yohachi
Publication year - 1995
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1995.tb08465.x
Subject(s) - materials science , dielectric , ceramic capacitor , ceramic , grain boundary , scanning electron microscope , x ray photoelectron spectroscopy , composite material , cathode , doping , anode , phase (matter) , dielectric loss , analytical chemistry (journal) , diffusion , microstructure , electrode , chemical engineering , capacitor , optoelectronics , chemistry , organic chemistry , voltage , chromatography , engineering , physics , quantum mechanics , thermodynamics
The reliability of the silver‐doped dielectric ceramic (Pb 0.875 Ba 0.25 ) 0.995 [(Mg 1/3 Nb 2/3 ) 0.5 (Zn 1/3 Nb 2/3 ) 0.3 Ti 0.2 ]O 3 was investigated to speculate on the effects of silver diffusion from internal electrodes into dielectric layers on the reliability of multilayer ceramic capacitors (MLCs). The addition of silver into the dielectric ceramic degraded the insulation resistance under humid loading conditions. Scanning transmission electron microscopy (STEM) revealed that a Pb‐rich grain boundary phase exists at triple points of Ag‐doped specimens. The Pb‐rich phase appeared to be PbO by X‐ray photoelectron spectroscopy (XPS). Degradation of insulation resistance was interpreted as a result of silver migration from the anode to the cathode through a grain boundary phase dissolved in water. Although silver diffusion from internal electrode layers in MLCs into dielectric layers was confirmed by STEM, a secondary phase was not observed. Intensive study is needed to clarify the effect of silver diffusion on degradation of insulation resistance of MLCs under humid loading conditions.